The GreCon CHIPINSPECTOR separates rubber, stones, metal and other foreign objects so that high panel quality and significant savings of material and production costs can be achieved.
Using a dual-energy method, nearly all foreign objects can be detected in the material supply and diverted before they reach downstream processes. Because of the material-specific absorption behaviour of different materials, materials of the same weight per unit area, such as wood and rubber, can now be reliably distinguished with this technology.
Contamination of the material flow can be identified regardless of the surface structure or moisture content of the raw material. Foreign objects are even identified in thick material layers of up to 50 mm. They will be reliably detected even if they are covered by chips. The reliable identification and diversion of rubber parts before defibration significantly reduces the risk of contamination of the panels.